Threshold voltage-related soft error degradation in a TFT SRAM cell

✍ Scribed by Ikeda, S.; Yoshida, Y.; Kamohara, S.; Imato, K.; Ishibashi, K.; Takahashi, K.

• Book ID: 114616969
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 498 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2002.808449