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Analytical Soft Error Models Accounting for Die-to-Die and Within-Die Variations in Sub-Threshold SRAM Cells
✍ Scribed by Mostafa, H.; Anis, M.H.; Elmasry, M.
- Book ID
- 118271248
- Publisher
- IEEE
- Year
- 2011
- Tongue
- English
- Weight
- 825 KB
- Volume
- 19
- Category
- Article
- ISSN
- 1063-8210
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