Threshold Voltage and Mobility Extraction of NBTI Degradation of Poly-Si Thin-Film Transistors

✍ Scribed by Hung-Chang Sun; Ching-Fang Huang; Yen-Ting Chen; Ting-Yun Wu; Chee Wee Liu; Hsu, Y.-J.; Chen, J.

• Book ID: 114620180
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 465 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2068550