✦ LIBER ✦
Degradation due to electrical stress of poly-Si thin film transistors with various LDD lengths
✍ Scribed by Yong-sang Kim; Min-koo Han
- Book ID
- 126662771
- Publisher
- IEEE
- Year
- 1995
- Tongue
- English
- Weight
- 245 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0741-3106
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