𝔖 Bobbio Scriptorium
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Thin reference layers available for calibration purposes in ion beam analysis

✍ Scribed by U. Wätjen; D. Schroyen; E. Bombelka; P. Rietveld


Book ID
113280792
Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
540 KB
Volume
50
Category
Article
ISSN
0168-583X

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