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Thin oxide thickness extrapolation from capacitance-voltage measurements

✍ Scribed by Walstra, S.V.; Chih-Tang Sah

Book ID: 114536882
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 244 KB
Volume: 44
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.595942

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