Extrapolation of high-voltage stress measurements to low-voltage operation for thin silicon-oxide films

✍ Scribed by Dumin, D.J.; Dickerson, K.J.; Brown, G.A.

• Book ID: 114555734
• Publisher: IEEE
• Year: 1991
• Tongue: English
• Weight: 741 KB
• Volume: 40
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/24.75344