✦ LIBER ✦
Extrapolation of high-voltage stress measurements to lowvoltage operation for thin silicon-oxide films : D. J. Dumin, K. J. Dickerson and G. A. Brown. IEEE Trans. Reliab.40(1), 102 (1991)
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 134 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0026-2714
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