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Thin-film transistors incorporating a thin, high-quality PECVD SiO/sub 2/ gate dielectric

โœ Scribed by D. Buchanan; J. Batey; E. Tierney


Book ID
126677335
Publisher
IEEE
Year
1988
Tongue
English
Weight
316 KB
Volume
9
Category
Article
ISSN
0741-3106

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