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Thin film thickness measurement by the conductivity theory in the framework of Born approximation

โœ Scribed by Jannesar, M.; Jafari, G.R.; Vasheghani Farahani, S.; Moradi, S.


Book ID
121820154
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
752 KB
Volume
562
Category
Article
ISSN
0040-6090

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