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Thickness dependence of the reflection coefficient from thin semiconductor films and measurements of the conductivity

✍ Scribed by Baruch Divon; Frank S. Barnes

Publisher
Elsevier Science
Year
1982
Weight
310 KB
Volume
6
Category
Article
ISSN
0379-6787

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Temperature dependence of the dielectric
Temperature dependence of the dielectric function of nonmetallic YBa2Cu3Ox in the interband range from transmission and reflection measurements on thin films
✍ R. Boyn; D. Wruck; M. Merbach; J.-P. MΓΌller πŸ“‚ Article πŸ“… 1994 πŸ› Elsevier Science 🌐 English βš– 616 KB

The interband dielectric function of nonmetallic YBa2Cu3Ox at energies below 4.5 eV, for E\_I\_ c polarisation, is obtained from transmission and reflection measurements on epitaxial thin films between 1.8 and 473 K. A significant temperature dependence is found, in particular, for the 1.75 eV and 4