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Dependence of the resistivity and hall coefficient in thin metallic films on the thickness and the transverse magnetic field

โœ Scribed by C.R. Pichard; A.J. Tosser; C.R. Tellier


Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
486 KB
Volume
81
Category
Article
ISSN
0040-6090

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