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Thin film nanolaminate analysis by simultaneous heavy ion recoil and X-ray spectrometry

✍ Scribed by A. Harjunmaa; T. Sajavaara; K. Arstila; K. Kukli; J. Keinonen

Book ID: 113822985
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 350 KB
Volume: 219-220
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2004.01.161

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