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Characterization of doped strontium sulfide thin films by secondary ion mass spectrometry, Rutherford backscattering spectrometry and X-ray fluorescence spectrometry

✍ Scribed by Lehto, Sari; Soininen, Pekka; Niinist�, Lauri; Likonen, Jari; Lappalainen, Reijo

Book ID: 124057984
Publisher: Royal Society of Chemistry
Year: 1994
Tongue: English
Weight: 569 KB
Volume: 119
Category: Article
ISSN: 0003-2654
DOI: 10.1039/AN9941901725

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