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Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profiling

✍ Scribed by N.P. Barradas; R. Mateus; M. Fonseca; M.A. Reis; K. Lorenz; I. Vickridge

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
352 KB
Volume
268
Category
Article
ISSN
0168-583X

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