Simultaneous determination of dispersion relation and depth profile of thorium fluoride thin film by spectroscopic ellipsometry

✍ Scribed by S.Y. Kim; K. Vedam

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 498 KB
• Volume: 166
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(88)90394-x