✦ LIBER ✦

Thickness measurement of a thin-film layer on an anisotropic substrate by phase-sensitive acoustic microscope

✍ Scribed by Sasaki, Y.; Endo, T.; Yamagishi, T.; Sakai, M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Spectrally resolved white–light phase–sh

✍ Debnath, Sanjit K.; Kothiyal, Mahendra P.; Schmit, Joanna; Hariharan, Parameswar 📂 Article 📅 2006 🏛 Optical Society of America 🌐 English ⚖ 101 KB

Thickness measurement of a thin hetero-o

✍ Kyung Joong Kim; Seung Mi Lee; Jong Shik Jang; Mona Moret 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 818 KB

Separation of C K-NEXAFS spectra for lay

✍ Endo, Osamu; Nakamura, Masashi; Amemiya, Kenta 📂 Article 📅 2013 🏛 Elsevier Science 🌐 English ⚖ 824 KB

Achieving a given reflectance for unpola

✍ Azzam, R. M. A. ;Giardina, Kurt A. 📂 Article 📅 1992 🏛 The Optical Society 🌐 English ⚖ 681 KB

Triclinic deformation and anisotropic st

✍ Hongmei Wang; Yiping Zeng; Hongwei Zhou; Meiying Kong 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 79 KB

The effect of gradual light absorption i

✍ Ludwik Silberstein 📂 Article 📅 1951 🏛 Elsevier Science 🌐 English ⚖ 352 KB 👁 1 views