Thermoresistive and Piezoresistive Properties of Wurtzite N-GaN
β Scribed by Mingiacchi, S. ;Lugli, P. ;Bonfiglio, A. ;Conte, G. ;Eickhoff, M. ;Ambacher, O. ;Rizzi, A. ;Passaseo, A. ;Visconti, P. ;Cingolani, R.
- Publisher
- John Wiley and Sons
- Year
- 2002
- Tongue
- English
- Weight
- 111 KB
- Volume
- 190
- Category
- Article
- ISSN
- 0031-8965
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β¦ Synopsis
We performed thermo and piezoresistive measurements on GaN bulk samples grown with different techniques (PIMBE, MOCVD). By analysing the I(V) characteristics as a function of temperature, we found a temperature coefficient of resistance (TCR ΒΌ a) of the same order of magnitude (a few percent per C) as commercial thermistors, with a peak value of 19%/ C. The measured gauge factor is about five, a value comparable with that obtained for GaN by other groups. We also performed PC vs. temperature measurements on a MQW GaN/AlGaN finding a peak shift of about 0.4 meV/K.
π SIMILAR VOLUMES
Photoconductivity of a non-intentionally doped GaN layer is observed for above band gap excitation. No below band gap excitation causes photoconductivity, but photoconductivity is optical quenched at energies of 1.28, 1.41, 1.53 and %2eV. The dark current and the yellow photoluminescence band show t