Thermionic emission model of electron gate current in submicron NMOSFETs

✍ Scribed by Hasnat, K.; Choh-Fei Yeap; Jallepalli, S.; Hareland, S.A.; Shih, W.-K.; Agostinelli, V.M.; Tasch, A.F.; Maziar, C.M.

• Book ID: 114536679
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 275 KB
• Volume: 44
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.554802