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Thermionic emission diffusion model of current conduction in polycrystalline silicon and temperature dependence of mobility

✍ Scribed by Singh, S. N.; Kishore, R.; Singh, P. K.


Book ID
126800113
Publisher
American Institute of Physics
Year
1985
Tongue
English
Weight
1021 KB
Volume
57
Category
Article
ISSN
0021-8979

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