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Thickness dependence of the temperature coefficient of resistivity of polycrystalline films in a three-dimensional conduction model

โœ Scribed by Pichard, C. R. ;Tellier, C. R. ;Tosser, A. J.


Publisher
John Wiley and Sons
Year
1981
Tongue
English
Weight
454 KB
Volume
65
Category
Article
ISSN
0031-8965

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