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Thickness dependence of temperature coefficient of resistance and neel temperature in MnTe films

โœ Scribed by V. Thanigaimani; M. A. Angadi


Publisher
Springer
Year
1993
Tongue
English
Weight
432 KB
Volume
12
Category
Article
ISSN
0261-8028

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in chromium silicide films with various values of the temperature coefficient of the resistance was measured. With the value 3 x 1O-6 K-' for the temperature coefficient of the resistance, R-' (dR/dT), l/f noise was higher than with the value 35 x 10d6 K-'. This is in disagreement with the theory of