Dependence of 1⨍ noise in CrSi2 films on the temperature coefficient of the resistance

✍ Scribed by J. Belan; V. Mikolaj; J. Valicek; K. Bok

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 223 KB
• Volume: 160
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/0921-4526(89)90055-0

✦ Synopsis

in chromium silicide films with various values of the temperature coefficient of the resistance was measured. With the value 3 x 1O-6 K-' for the temperature coefficient of the resistance, R-' (dR/dT), l/f noise was higher than with the value 35 x 10d6 K-'. This is in disagreement with the theory of equilibrium fluctuations in temperature.