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Thermally stimulated emission from traps and related problems in SnO2 monocrystals

✍ Scribed by Fillard, J. P. ;Gasiot, J. ;de Murcia, M.

Publisher
John Wiley and Sons
Year
1970
Tongue
English
Weight
360 KB
Volume
3
Category
Article
ISSN
0031-8965

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## Abstract An analytic expression for the probability of thermal activation of electrons trapped in deep defect states of an insulator is derived taking explicitly into account an electric field and lattice vibrations. From the activation probability a detrapping current intensity is calculated, w