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Thermally-stimulated current from the gold acceptor trapping level in silicon : R. J. Bassett and C. A. Hogarth. Int. J. Electron.33, No. 2 (1972), p. 217


Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
114 KB
Volume
12
Category
Article
ISSN
0026-2714

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