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Thermal stability of Ru, Pd and Al Schottky contacts to p-type 6H-SiC

✍ Scribed by A. Venter; M. E. Samiji; A. W. R. Leitch

Book ID
104556589
Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
143 KB
Volume
1
Category
Article
ISSN
1862-6351

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## Abstract The effects of rapid thermal annealing on the electrical and structural properties of Pd/Au Schottky contacts to n‐type InP(111) have been investigated by current–voltage (__I__ –__V__), capacitance–voltage (__C__ –__V__) and X‐ray diffraction (XRD) measurements. The barrier height of t