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Thermal-Safe Test Scheduling for Core-Based System-on-Chip Integrated Circuits

โœ Scribed by Rosinger, P.; Al-Hashimi, B.M.; Chakrabarty, K.


Book ID
117907671
Publisher
IEEE
Year
2006
Tongue
English
Weight
418 KB
Volume
25
Category
Article
ISSN
0278-0070

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