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Between-core vector overlapping for efficient core testing of system-on-chip LSI circuits

✍ Scribed by Tsuyoshi Shinogi; Yuki Yamada; Terumine Hayashi; Tomohiro Yoshikawa; Shinji Tsuruoka


Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
667 KB
Volume
89
Category
Article
ISSN
8756-663X

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