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Thermal instability of the TiSi2/Si structure: Impurity effects

✍ Scribed by S. Ogawa; T. Yoshida; T. Kouzaki; S. Okuda; K. Tsukamoto

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 627 KB
Volume: 41-42
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(89)90073-1

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