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Thermal characterization of film-on-substrate system by photothermal method and genetic algorithm

โœ Scribed by Z. J. Chen; J. W. Fang; S. Y. Zhang

Book ID
111633295
Publisher
Springer-Verlag
Year
2008
Tongue
English
Weight
133 KB
Volume
153
Category
Article
ISSN
1951-6355

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An in situ, noncontact, photothermal displacement interferometer for performing thermal diffusivity measurements on bulk and thin-fihn materials has been developed. Localized transient surface motion is generated through photothermoelastic coupling of a pulsed, heating laser beam to the sample under