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Thermal analysis on zone-melting recrystallization of silicon-on-insulator films using a finite difference method

✍ Scribed by H.H Richter; B Tillack; H Andrä; W Weinelt

Book ID: 108026782
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 323 KB
Volume: 173
Category: Article
ISSN: 0921-5093
DOI: 10.1016/0921-5093(93)90187-j

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