Theory of the implementation of the fundamental parameter method for the X-ray fluorescence determination of low-atomic-number elements
β Scribed by G. V. Pavlinsky; A. Yu. Dukhanin; E. O. Baranov; A. Yu. Portnoy
- Book ID
- 110211543
- Publisher
- SP MAIK Nauka/Interperiodica
- Year
- 2006
- Tongue
- English
- Weight
- 156 KB
- Volume
- 61
- Category
- Article
- ISSN
- 1061-9348
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X-ray fluorescence (XRF) has been widely used for the elemental analysis in the field of quality control of processes and research since it has the capability of performing non-destructive analysis and requires easy-to-prepare samples. In general, quantitative analysis is carried out by the calibrat
The results of analyses carried out with the fundamental parameters method without explicit knowledge of the beam exciting the sample are presented. The excitation beam is described by means of the fluorescence produced by a set of thick or thin targets of pure chemical elements. The results are com