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Determination of low atomic number elements by X-ray fluorescence fundamental parameter method

✍ Scribed by G. V. Pavlinskii; L. I. Vladimirova


Book ID
110212161
Publisher
SP MAIK Nauka/Interperiodica
Year
2009
Tongue
English
Weight
142 KB
Volume
64
Category
Article
ISSN
1061-9348

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X-ray fluorescence (XRF) has been widely used for the elemental analysis in the field of quality control of processes and research since it has the capability of performing non-destructive analysis and requires easy-to-prepare samples. In general, quantitative analysis is carried out by the calibrat