X-Ray fluorescence analysis utilizing the fundamental parameter method for the determination of the elemental composition in plant samples

✍ Scribed by Juichi Omote; Hisayuki Kohno; Katsuhisa Toda

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 845 KB
• Volume: 307
• Category: Article
• ISSN: 0003-2670
• DOI: 10.1016/0003-2670(95)00033-v

✦ Synopsis

X-ray fluorescence (XRF) has been widely used for the elemental analysis in the field of quality control of processes and research since it has the capability of performing non-destructive analysis and requires easy-to-prepare samples. In general, quantitative analysis is carried out by the calibration curve method, obtained with many standard samples. However, for some applications, such as a plant sample, it may be difficult to prepare standard materials. The recent development of the fundamental parameter (FP) method makes it possible to perform a quantitative analysis using a few standards or reference samples. In the analysis program semiquantitative results can be calculated using the X-ray intensities of the detected elements. The recent application of XRF to plant analysis using the FP method is discussed in this paper.