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Theoretical Study of Ge Implanted Silicon Subjected to Pulsed Excimer (XeCl) Laser Radiation

✍ Scribed by D. Klinger; Prof. J. Auleytner; D. Z̊ymierska

Publisher: John Wiley and Sons
Year: 1996
Tongue: English
Weight: 229 KB
Volume: 31
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.2170310705

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