๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Theoretical Modeling of Obliquely Crossed Photothermal Deflection for Thermal Conductivity Measurements of Thin Films

โœ Scribed by B. C. Li; S. Y. Zhang

Book ID
110421650
Publisher
Springer
Year
1998
Tongue
English
Weight
422 KB
Volume
19
Category
Article
ISSN
0195-928X

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Thermal conductivity measurements of syn
Thermal conductivity measurements of synthetic diamond films using the photothermal beam deflection technique
โœ A.N. Petrovsky; A.O. Salnick; D.O. Mukhin; B.V. Spitsyn ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 130 KB

The non-destructive and non-contact photothermal beam deflection method has been applied to thin synthetic diamond films to give thermal conductivity measurements. The thickness of the diamond film was 12-50 /zm on silicon and tungsten substrates. The maximum film thermal conductivity value obtained