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The measurement of thermal conductivities using the photothermal deflection method for thin films with varying thickness

โœ Scribed by H. J. Kim; J. H. Kim; P. S. Jeon; J. Yoo

Book ID
107624723
Publisher
Springer-Verlag
Year
2009
Tongue
English
Weight
696 KB
Volume
23
Category
Article
ISSN
1738-494X

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โœ A.N. Petrovsky; A.O. Salnick; D.O. Mukhin; B.V. Spitsyn ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 130 KB

The non-destructive and non-contact photothermal beam deflection method has been applied to thin synthetic diamond films to give thermal conductivity measurements. The thickness of the diamond film was 12-50 /zm on silicon and tungsten substrates. The maximum film thermal conductivity value obtained