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Photothermal methods for the measurement of thermal properties of thin polymer films

✍ Scribed by H. Coufal

Publisher
Society for Plastic Engineers
Year
1991
Tongue
English
Weight
666 KB
Volume
31
Category
Article
ISSN
0032-3888

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The photothermal method has been used in order to determine the thermal properties of semiconductors. In this work, a simple expression for the periodic temperature, at the sample's surface, which is valuable for a number of layers deposited on a substrate, was introduced. This expression showed a v