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Theoretical analysis of the breakdown voltage in pseudomorphic HFETs

✍ Scribed by Eisenbeiser, K.W.; East, J.R.; Haddad, G.I.

Book ID: 114536599
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 799 KB
Volume: 43
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.542421

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