✦ LIBER ✦

The yield models and defect density monitors for integrated circuit diagnosis

✍ Scribed by R.K. Nahar

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 557 KB
Volume: 33
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(93)90008-m

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Point defect yield model for wafer scale

Point defect yield model for wafer scale integration : Mark B. Ketchen. IEEE Circuits Devices Mag., 24 (July 1985)

📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 118 KB

New integral representations of circuit

New integral representations of circuit models and elements for the circuit technique for semiconductor device analysis

✍ C.T. Sah 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 492 KB

The use and evaluation of yield models i

The use and evaluation of yield models in integrated circuit manufacturing : James A. Cunningham. IEEE Trans. Semicond. Mfg 3(2), 60 (1990)

📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 120 KB

Modelling of the MOS integrated circuit

Modelling of the MOS integrated circuit yield associated with random defects of dielectric layers : Krzysztof Kucharski and Wieslaw Marciniak. Electron Technol.19(3/4), 47 (1986)

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 126 KB

A novel technique for the direct determi

A novel technique for the direct determination of multimode equivalent circuit models for substrate integrated waveguide discontinuities

✍ Maurizio Bozzi; Luca Perregrini; Ke Wu 📂 Article 📅 2009 🏛 John Wiley and Sons 🌐 English ⚖ 349 KB 👁 1 views

A novel technique is presented for the automatic, self-consistent and direct determination of wide-band lumped-element equivalent circuit models of substrate integrated waveguide discontinuities. This technique is based on the full-wave analysis of substrate integrated waveguide components by using

Yield model for in-line integrated circu

Yield model for in-line integrated circuit production control : S. Simitrijev, N. Stojadinovic and Z. Stamenkovic. Solid-St. Electron.31, 975 (1988)

📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 128 KB