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The use and evaluation of yield models in integrated circuit manufacturing : James A. Cunningham. IEEE Trans. Semicond. Mfg 3(2), 60 (1990)

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 120 KB
Volume: 31
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(91)90447-f

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📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 92 KB