✦ LIBER ✦
A discussion of yield modeling with defect clustering, circuit repair and circuit redundancy : Timothy L. Michalka, Ramesh C. Varshney and James D. Meindl. IEEE Trans. Semicond. Mfg.3(3), 116 (1990)
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 92 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0026-2714
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