✦ LIBER ✦
Modelling of the MOS integrated circuit yield associated with random defects of dielectric layers : Krzysztof Kucharski and Wieslaw Marciniak. Electron Technol.19(3/4), 47 (1986)
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 126 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0026-2714
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