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The void fraction of rf-sputtered SrTiO3 film characterized by spectroscopic ellipsometry

✍ Scribed by P.K. Shon; B.S. Jeong; H.L. Park

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
376 KB
Volume
95
Category
Article
ISSN
0038-1098

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