Analysis of a surface film ~4 nm thick formed on electropolished, high-purity aluminium given a postelectropolishing treatment in a hot CrO 3 -H 3 PO 4 solution demonstrates the suitability of glow discharge optical emission spectroscopy for in-depth analysis of very thin films. Thus, the distributi
β¦ LIBER β¦
The Versatility of GDOES: From Bulk Analysis to Thin Film and Surface Analysis
β Scribed by C. Xhoffer; H. Dillen
- Book ID
- 106169797
- Publisher
- Springer Vienna
- Year
- 2007
- Weight
- 163 KB
- Volume
- 152
- Category
- Article
- ISSN
- 0005-8912
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
GDOES depth profiling analysis of a thin
β
Shimizu, K.; Habazaki, H.; Skeldon, P.; Thompson, G. E.; Wood, G. C.
π
Article
π
1999
π
John Wiley and Sons
π
English
β 170 KB
π 2 views
Elemental analysis of surfaces and thin
β
K.-H. MΓΌller
π
Article
π
1989
π
Elsevier Science
π
English
β 978 KB
Influence of argon pressure on the depth
β
Shimizu, K.; Habazaki, H.; Skeldon, P.; Thompson, G. E.; Wood, G. C.
π
Article
π
2000
π
John Wiley and Sons
π
English
β 142 KB
π 2 views
The influence of Ar pressure on depth resolution during glow discharge optical emission spectroscopy (GDOES) depth profiling has been examined through the use of 358 nm thick anodic alumina films grown over flat aluminium surfaces. The films are ideal standards for the present purpose, being amorpho
Fractal and multifractal analysis of LiF
β
Yadav, R.P.; Dwivedi, S.; Mittal, A.K.; Kumar, M.; Pandey, A.C.
π
Article
π
2012
π
Elsevier Science
π
English
β 694 KB
Depth profiling by GDOES: application of
β
J. Michler; M. Aeberhard; D. Velten; S. Winter; R. Payling; J. Breme
π
Article
π
2004
π
Elsevier Science
π
English
β 137 KB
The bulk and surface structures of thin
β
M. H. B. Stiddard
π
Article
π
1985
π
Springer
π
English
β 384 KB