✦ LIBER ✦
Depth profiling by GDOES: application of hydrogen and d.c. bias voltage corrections to the analysis of thin oxide films
✍ Scribed by J. Michler; M. Aeberhard; D. Velten; S. Winter; R. Payling; J. Breme
- Book ID
- 114085748
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 137 KB
- Volume
- 447-448
- Category
- Article
- ISSN
- 0040-6090
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