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The use of a four-point probe for profiling sub-micron layers

✍ Scribed by R.S. Huang; P.H. Ladbrooke

Book ID: 107856386
Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 484 KB
Volume: 21
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(78)90347-7

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