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The use of a four-point probe for profiling sub-micron layers : R. S. Huang and P. H. Ladbrooke. Solid-St. Electron. 21, 1123 (1978)

Book ID: 103278681
Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 244 KB
Volume: 19
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(79)90273-7

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📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 64 KB