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The study of hydrogenation effect for the deep levels in GaN epilayers

✍ Scribed by Yoon Shon; Nam Hwa Kim; Young Hae kwon; Deuk Young Kim; Shavkat U. Yuldashev; Woon Hyung Jung; Tae Won Kang


Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
119 KB
Volume
1
Category
Article
ISSN
1567-1739

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One more deep level related to the metas
✍ O.A. Soltanovich; E.B. Yakimov; E.V. Erofeev; V.A. Kagadei; J. Weber πŸ“‚ Article πŸ“… 2009 πŸ› Elsevier Science 🌐 English βš– 236 KB

A deep trap with energy level at E C -0.45 eV is detected in n-type GaAs epilayers after hydrogenation. This level exhibits a bias-dependent annealing behaviour in the temperature range 290-400 K. The relation of this defect to the well-known metastable hydrogen-related M3/M4 defect is discussed.