The stability of polycrystalline silicon thin film resistors measured using excess noise

✍ Scribed by B.K. Jones; E.S.C. Mzunzu

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 162 KB
• Volume: 29
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(89)90342-9